A new method in electron microscopy enables sub-20-picometer targeting of individual atoms without prior exposure, opening the door to atom-specific analysis and control. (Nanowerk Spotlight) ...
Microscope images could be obtained much more quickly -- rather than one pixel at a time -- thanks to a new imaging method for neutral atomic beam microscopes. It could ultimately lead to engineers ...
Creating complex structures at the tiniest scales has long been a challenge for engineers. But new research from Georgia Tech shows how electron beams, already widely used in imaging and fabrication, ...