Delay-inducing defects are causing increasing concern in the semiconductor industry today, particularly at the leading-edge 130- and 90- nanometer nodes. To effectively test for such defects, the ...

The 2002 NEC implemented new requirements to help reduce the number of electrical fires caused by parallel arc faults in branch circuit wiring. All branch circuits supplying bedrooms in single-family ...

EAST AURORA, N.Y.--(BUSINESS WIRE)--Astronics Corporation (NASDAQ:ATRO), a leading provider of advanced technologies for the global aerospace, defense and semiconductor industries, announced today ...

A new technical paper titled “Aging Aware Steepening of the Fault Coverage Curve of a Scan Based Transition Fault Test Set” was published by researchers at Purdue University. “Chip aging may result in ...

When semiconductor devices had geometries of 0.18 microns and larger, most defects manifested themselves as static faults. Test strategies based on stuck-at fault-model scan patterns and standard ...

Download this article in PDF format. Finding the right balance among test cost, test quality, and data collection for running diagnosis requires consideration of several competing factors. Luckily ...

New non-volatile memories (NVM) bring new opportunities for changing how we use memory in systems-on-chip (SoCs), but they also add new challenges for making sure they will work as expected. These new ...

HD Electric Co. now offers its new Underground Cable Fault Tester, the UCT-8, a lightweight one-piece tool that is used to test underground de-energized primary shielded voltage cables for faults.

HVI can engineer and assemble a complete package for cable testing and/or fault locating, installed on a common platform ready to drop into your van or truck. Aug. 18, 2009 HVI can engineer and ...

The new Fisher Pierce® TPM Series Test Point Mounted Fault Indicator from Thomas & Betts helps workers locate faulted circuits in underground distribution systems quickly. The new Fisher Pierce® TPM ...