On-wafer measurement techniques provide an essential pathway for characterising the performance of semiconductor devices at millimetre-wave frequencies. By directly interfacing with devices on the ...

The measurement technique of an aspheric surface is mainly for the surface form and parameters. The surface form is the three-dimensional distribution of the surface in the spatial domain. The ...

Microwave frequency measurement techniques are at the forefront of modern research, enabling accurate real-time analysis of high-speed signals for applications ranging from next-generation ...