SLE has introduced a scan insertion tool – ScanBlaster is designed to take physical effects into account very early, and to be compatible with many standard test insertion methodologies. The tool can ...

The standard approach for testing IC logic is the use of scan chains, with embedded compression as the standard approach for applying scan patterns. Embedded compression enables the same test quality ...

In the real world, we are slaves to our environment. The decisions we make are dependent on the resources available at any given time. In school, I remember coming up with a binary decision diagram ...

Integrated circuit complexity and integration continuously advances, posing challenges to the development process. Market profitability, however, demands that products be designed and produced as fast ...