Specular reflection from a surface that is smooth on the scale of the wavelength of the observation can be used to diagnose surface liquid. We searched for specular reflection in high-resolution ...

Measuring super smooth surfaces generally necessitates the use of optical metrology tools, but it is important to note that optical solutions are not all the same. The choice of metrology solution for ...

Total reflection X-rays fluorescence (TXRF) is a surface elemental analysis technique often used for the ultra-trace analysis of particles, residues, and impurities on smooth surfaces. Due to its ...

Light collection efficiency is an important factor that affects the performance of many optical and optoelectronic devices. In these devices, the high reflectivity of interfaces can hinder efficient ...