When gathering a measurement using a spectroscopy instrument, the user wants to be confident in the result. Whether the technique is OES, XRF, or LIBS, or if thickness or composition are measured, the ...

Systematic errors are caused by defective parts like incorrectly adjusted optics or interfering influences such as a dirty light path, and can lead to measurement result deviation from the real value.

Very often, in the test and measurement industry, a measurement is made by instrumentation, which is often subject to errors. It is difficult to estimate the true value of the measured quantity given ...