The circuit has been constructed to provide an in-circuit system that will test the integrity of electronic components such as Silicon Controlled Rectifiers, diodes, and PNP or NPN transistors. 4093 – ...

Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.

There are a number of complex tasks involved in the manufacturing of electronic assemblies, all of which can go wrong. In order to ensure quality standards are met, the fabrication of the printed ...

This file type includes high resolution graphics and schematics. The spread of h FE values in a batch of transistors may be wide enough to cause unreliable performance during mass production of a ...

Researchers previously reported a self-aligned technique for making graphene transistors with unparalleled speed, but scalability was a question. The team now uses a dielectrophoresis assembly ...