ZEISS introduces its new field emission scanning electron microscope (FE-SEM) ZEISS GeminiSEM 450. The instrument combines ultrahigh resolution imaging with the capability to perform advanced ...
The Carl Zeiss AURIGA CrossBeam Focused Ion Beam Electron Microscope is a state-of-the-art advanced scanning electron microscope integrated with high-resolution focused ion beam milling that enables ...
Carl Zeiss SMT has launched a new SEM (scanning electron microscope), as well as upgrades to existing electron microscopes and an argon ion beam column for its NVision 40 CrossBeam nanoscale ...
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Universal software designed to operate any ZEISS light or electron microscope Easy navigation, streamlined SEM operation, and integrated EDS analysis Solution for connected microscopy WHITE PLAINS, ...
Combine field emission SEM (FE-SEM) technology with advanced analytics. Profit from proven Gemini electron optics. Choose from a variety of detector options: you can image particles, surfaces, and ...
McMaster University enables new innovative capability in multi-length scale experiments for materials across diverse research fields through a new partnership between the Canadian Centre for Electron ...
The inverted Zeiss CLSM 510 laser scanning confocal microscope is equipped with three PMT detectors, seven laser lines (405, 458, 477, 488, 514, 543, 633 nm), motorized Z-drive and a wide range of ...
Zeiss Microscopy, Jena, Germany, a manufacturer of visible, electron, X-ray and ion microscope systems, has added two super-resolution microscopes to its structured illumination microscopy (SIM) range ...
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